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Optimizing FinFET Geometry and Parasitics for RF Applications

Bibliographic reference Kranti, A. ; Raskin, Jean-Pierre ; Armstrong, G.A.. Optimizing FinFET Geometry and Parasitics for RF Applications.IEEE International SOI Conference, SOI’2008 (Hudson River Valley, New York, USA, du 06/10/2008 au 09/10/2008). In: Proceedings of the IEEE International SOI Conference, SOI’2008, 2008, p.pp. 123-124
Permanent URL http://hdl.handle.net/2078.1/91591