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The impact of externally applied mechanical stress on analog and RF performances of SOI MOSFETs

Bibliographic reference Emam, Mostafa ; Houri, Samer ; Vanhoenacker-Janvier, Danielle ; Raskin, Jean-Pierre. The impact of externally applied mechanical stress on analog and RF performances of SOI MOSFETs.8th Diagnostics & Yield Symposium (Warszaw, Poland, du 22/06/2009 au 24/06/2009). In: Proceedings of the 8th Diagnostics & Yield Symposium, 2009
Permanent URL http://hdl.handle.net/2078.1/91580