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Application of ToF-SIMS to the surface characterization of catalysts

Bibliographic reference Bertrand, Patrick ; Poleunis, Claude ; Weng, Lu Tao ; Devillers, Michel ; De Smet, Frédéric ; et. al. Application of ToF-SIMS to the surface characterization of catalysts.The Physical Electronics Seminar on "ToF-SIMS characterization of catalysts and inorganic compounds" (Baarn, The Netherlands, February).
Permanent URL http://hdl.handle.net/2078.1/91538