User menu

On-wafer and free space characterization of materials and devices for mm-wave imaging

Bibliographic reference Roda Neve, Cesar ; Spiegel, Judith ; Molenberg, Isabel ; Huynen, Isabelle ; Elhawil, A. ; et. al. On-wafer and free space characterization of materials and devices for mm-wave imaging.Workshp on Millimeter Wave Imaging and Technologies for Security Applications, KUL (Leuven, Belgium, du 09/07/2009 au 09/07/2009). In: Proceedings of the Workshp on Millimeter Wave Imaging and Technologies for Security Applications, KUL, 2009, p. Paper 9
Permanent URL http://hdl.handle.net/2078.1/91429