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Electronic Semiconductor Characterization Tool (ESC): From measured DC and RF parameters to a wideband electrical equivalent circuit

Bibliographic reference Emam, Mostafa ; Roda Neve, Cesar ; Vanhoenacker-Janvier, Danielle ; Raskin, Jean-Pierre. Electronic Semiconductor Characterization Tool (ESC): From measured DC and RF parameters to a wideband electrical equivalent circuit.MOS-AK/ESSDERC/ESSCIRC Workshop - MOS Modeling and Parameter Extraction Working Group (Athens, Greece, du 18/09/2009 au 18/09/2009). In: Proceedings of the MOS-AK/ESSDERC/ESSCIRC Workshop - MOS Modeling and Parameter Extraction Working Group, 2009, p. Paper C
Permanent URL http://hdl.handle.net/2078.1/91407