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Efficient Single Event Upset Simulations of a Tolerant PD SOI CMOS D Flip-Flop

Bibliographic reference Alvarado Pulido, José Joaquin ; Kilchytska, Valeriya ; Berger, G. ; Flandre, Denis. Efficient Single Event Upset Simulations of a Tolerant PD SOI CMOS D Flip-Flop.10th European Conference on Radiation Effects on Components and Systems (RADECS'09) (Bruges (Belgium), du 14/09/2009 au 18/09/2009). In: Proceedings of RADECS'09, 10th European Conference on Radiation Effects on Components and Systems, 2009, p.225-229
Permanent URL http://hdl.handle.net/2078.1/90391