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Impact of temperature reduction and channel engineering on the linearity of FD SOI nMOSFETs

Bibliographic reference de Souza, Michelly ; Flandre, Denis ; Martino, J.A. ; Simoen, Eddy ; Claeys, Cor ; et. al. Impact of temperature reduction and channel engineering on the linearity of FD SOI nMOSFETs.EUROSOI Conference 2009 (Göteborg (Sweden), du 19/01/2009 au 21/01/2009). In: Proceedings of the EUROSOI Conference 2009, 2009
Permanent URL http://hdl.handle.net/2078.1/90341