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Graded-channel SOI nMOSFET model valid for harmonic distortion evaluation

Bibliographic reference de Souza, Michelly ; Pavanello, Marcelo Antonio ; Cerdeira, A. ; Flandre, Denis. Graded-channel SOI nMOSFET model valid for harmonic distortion evaluation.25th International Conference on Microelectronics (MIEL 2006) (Belgrade (Serbia and Montenegro), du 14/05/2006 au 17/05/2006). In: Proceedings of the 25th International Conference on Microelectronics (MIEL 2006), 2006, p.476-479
Permanent URL http://hdl.handle.net/2078.1/90157