User menu

Accès à distance ? S'identifier sur le proxy UCLouvain | Saint-Louis

Relevant modelling & Comparison of geometric distorsions in watermarking systems

Bibliographic reference Delannay, Damien ; Setyawan, Iwan ; Lagendijk, R.1. ; Macq, Benoît. Relevant modelling & Comparison of geometric distorsions in watermarking systems.SPIE 47th Annual Meeting - Optical Science and Technology (Seattle, USA, July 1-11, 2002).
Permanent URL http://hdl.handle.net/2078.1/88473