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Study of neutron irradiation effects on SOI and strained SOI MuGFETs assessed by low-frequency noise

Bibliographic reference Simoen, E. ; Put, S. ; Claeys, C. ; Kilchytska, Valeriya ; Alvarado Pulido, José Joaquin ; et. al. Study of neutron irradiation effects on SOI and strained SOI MuGFETs assessed by low-frequency noise. In: ECS Transactions, Vol. 31, no. 1, p. 43-50 (2010)
Permanent URL http://hdl.handle.net/2078.1/88050