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Self-Heating Effect characterisation in SOI FinFETs

Bibliographic reference Makovejev, Sergej ; Olsen, S. ; Dehan, M. ; Raskin, Jean-Pierre. Self-Heating Effect characterisation in SOI FinFETs.ULtimate Integration on Silicon - ULIS’10 (Glasgow, Scotland, du 17/03/2010 au 19/03/2010). In: Proceedings of the ULtimate Integration on Silicon - ULIS’10, 2010, p.pp. 9-12
Permanent URL http://hdl.handle.net/2078.1/86710