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Accurate SOI MOSFET characterization at microwave frequencies

Bibliographic reference Raskin, Jean-Pierre ; Dambrine, Gilles ; Vanhoenacker-Janvier, Danielle. Accurate SOI MOSFET characterization at microwave frequencies.4th Symposium Diagnostics and Yield, SOI – materials, devices and characterization (Warszaw, Poland, du 22/04/1998 au 25/04/1998). In: Proceedings of the 4th Symposium Diagnostics and Yield, SOI – materials, devices and characterization, 19981998, p. 2 pages
Permanent URL http://hdl.handle.net/2078.1/86040