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On-wafer wideband electrical characterization : a powerful tool for improving the IC technologies

Bibliographic reference Lederer, Dimitri ; Raskin, Jean-Pierre. On-wafer wideband electrical characterization : a powerful tool for improving the IC technologies. In: Journal of Telecommunications and Information Technology, , no. 2, p. 69-77 (February 2007)
Permanent URL http://hdl.handle.net/2078.1/85840