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Behaviour of TFMS and CPW line on SOI substrate versus high temperature for RF applications

Bibliographic reference Si Moussa, Mehdi ; Pavageau, Christophe ; Lederer, Dimitri ; Picheta, L. ; Danneville, François ; et. al. Behaviour of TFMS and CPW line on SOI substrate versus high temperature for RF applications. In: Solid-State Electronics, Vol. 50, no. 11-12, p. 1822-1827 (2006)
Permanent URL http://hdl.handle.net/2078.1/85702