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An investigation of noise phenomena in fabricated fully-deplated Silicon-on-Insulator MOSFETs by means of ensemble Monte Carlo simulations

Bibliographic reference Rengel, R. ; González, T. ; Mateos, Javier ; Pardo, D. ; Dambrine, Gilles ; et. al. An investigation of noise phenomena in fabricated fully-deplated Silicon-on-Insulator MOSFETs by means of ensemble Monte Carlo simulations. In: IEEE Transactions on Electron Devices, Vol. 53, no. 3, p. 523-532 (March)
Permanent URL http://hdl.handle.net/2078.1/85692