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The impact of externally applied mechanical stress on analog and RF performances of SOI MOSFETs

Bibliographic reference Emam, Mostafa ; Houri, Samer ; Vanhoenacker-Janvier, Danielle ; Raskin, Jean-Pierre. The impact of externally applied mechanical stress on analog and RF performances of SOI MOSFETs. In: Journal of Telecommunications and Information Technology, no. 4, p. 18-24 (2009)
Permanent URL http://hdl.handle.net/2078.1/85654