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New RF series extrinsic resistances extraction procedure for deep-submicron MOS transistors

Bibliographic reference Tinoco, J.C. ; Raskin, Jean-Pierre. New RF series extrinsic resistances extraction procedure for deep-submicron MOS transistors. In: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, Vol. 23, no. 2, p. 107-126 (2010)
Permanent URL http://hdl.handle.net/2078.1/85588
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