User menu

Mobility degradation and transistor asymmetry impact on field effect transistor access resistances extraction

Bibliographic reference Tinoco, J.C. ; Martinez-Lopez, A.G. ; Raskin, Jean-Pierre. Mobility degradation and transistor asymmetry impact on field effect transistor access resistances extraction. In: Solid-State Electronics, Vol. 56, no. 1, p. 214-218 (February 2011)
Permanent URL http://hdl.handle.net/2078.1/85528