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In situ (XPS) and ex situ (XPS and ToF-SIMS) studies of the Nylon 6 and PMMA treated in remote O2 and O2-N2 plasmas

Bibliographic reference Scheuer, Anne ; Prat, R ; Deville, J. P. ; Léonard, Didier ; Bertrand, Patrick. In situ (XPS) and ex situ (XPS and ToF-SIMS) studies of the Nylon 6 and PMMA treated in remote O2 and O2-N2 plasmas.12th International Symposium on Plasma Chemistry ISPC 12 (Minneapolis MN - USA, du 21/08/1995 au 25/08/1995). In: J.V. Heberlein, D.W. Ernie, J. T. Roberts, Proceedings of the 12th International Symposium on Plasma Chemistry ISPC 12, Univ. of Minnesotan1995, p. 185-190
Permanent URL http://hdl.handle.net/2078.1/84140