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Deph profiling on Ta2O5 thin layer on Ta foil by ion scattering spectrometry

Bibliographic reference Rummens, F. ; Bertrand, Patrick ; De Puydt, Yves. Deph profiling on Ta2O5 thin layer on Ta foil by ion scattering spectrometry. In: R. Kelly and M. Fernanda da Silva, Materials Modifications by High-fluence Ion Beams, Kluwer Academic Publishers  1988, p. 101-109
Permanent URL http://hdl.handle.net/2078/83563