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Evidence of simple intramolecular rearrangement at polymer end groups in secondary ion mass spectrometry.

Bibliographic reference Vanden Eynde, Xavier ; Oike ; Hamada ; Tezuka ; Bertrand, Patrick. Evidence of simple intramolecular rearrangement at polymer end groups in secondary ion mass spectrometry.. In: Rapid communications in mass spectrometry : RCM, Vol. 13, no. 19, p. 1917-1923 (1999)
Permanent URL http://hdl.handle.net/2078.1/8353
  1. Quirk Roderic P., Lynch Thomas, Anionic synthesis of primary amine-functionalized polystyrenes using 1-[4-[N,N-bis(trimethylsilyl)amino]phenyl]-1-phenylethylene, 10.1021/ma00058a002
  2. WEBSTER O. W., Living Polymerization Methods, 10.1126/science.251.4996.887
  3. , , , , . In Proc. 10th International Conference on Secondary Ion Mass Spectrometry SIMS X, , , (eds). J. Wiley & Sons: Chichester, 1997; 173.
  4. Hunt M. O., Belu A. M., Linton R. W., DeSimone J. M., End-functionalized polymers. 1. Synthesis and characterization of perfluoroalkyl-terminated polymers via chlorosilane derivatives, 10.1021/ma00070a020
  5. Jackson Anthony T., Yates Hilary T., Scrivens James H., Critchley Glenn, Brown Jeff, Green Martin R., Bateman Robert H., The Application of Matrix-assisted Laser Desorption/Ionization Combined with Collision-induced Dissociation to the Analysis of Synthetic Polymers, 10.1002/(sici)1097-0231(199610)10:13<1668::aid-rcm703>3.0.co;2-i
  6. Jackson Anthony T., Jennings Keith R., Scrivens James H., Generation of average mass values and end group information of polymers by means of a combination of matrix-assisted laser desorption/ionization-mass spectrometry and liquid secondary ion-tandem mass spectrometry, 10.1016/s1044-0305(96)00131-6
  7. Scrivens J.H., Jackson A.T., Yates H.T., Green M.R., Critchley G., Brown J., Bateman R.H., Bowers M.T., Gidden J., The effect of the variation of cation in the matrix-assisted laser desorption/ionisation-collision induced dissociation (MALDI-CID) spectra of oligomeric systems, 10.1016/s0168-1176(97)00239-5
  8. Belu A. M., Hunt M. O., DeSimone J. M., Linton R. W., End-Functionalized Polymers. 2. Quantification of Functionalization by Time-of-Flight Secondary Ion Mass Spectrometry, 10.1021/ma00085a037
  9. Peters M. A., Belu A. M., Linton R. W., Dupray L., Meyer T. J., DeSimone J. M., Termination of Living Anionic Polymerizations Using Chlorosilane Derivatives: A General Synthetic Methodology for the Synthesis of End-Functionalized Polymers, 10.1021/ja00117a008
  10. Muddiman David C., Brockman Adam H., Proctor Andrew, Houalla Marwan, Hercules David M., Characterization of Polystyrene on Etched Silver Using Ion Scattering and X-ray Photoelectron Spectroscopy: Correlation of Secondary Ion Yield in Time-of-Flight SIMS with Surface Coverage, 10.1021/j100095a044
  11. Vanden Eynde X., Bertrand P., Jérôme R., Molecular Weight Effects on Polystyrene Fingerprint Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Spectra, 10.1021/ma9702049
  12. Vanden Eynde X., Bertrand P., Quantification of polystyrene blend surfaces based on end group ToF-SIMS analysis, 10.1016/s0169-4332(98)00626-6
  13. , , . In Proc. International Conference on Polymer-Solid Interface (2nd edn), , . (Eds). Presses Universitaires de Namur, 1998; 473.
  14. Briggs D., Surface analysis of polymers by XPS and static SIMS, ISBN:9780511525261, 10.1017/cbo9780511525261
  15. Vanden Eynde X., Matyjaszewski K., Bertrand P., Static SIMS spectra of polystyrene obtained by ‘living’ radical polymerization. Part I: Molecular weight-dependent fragmentation, 10.1002/(sici)1096-9918(199807)26:8<569::aid-sia403>3.0.co;2-2
  16. Shard A. G., Davies M. C., Schacht E., Chain End Contribution in Static Secondary Ion Mass Spectrometry of Oligomeric Poly(ethylene glycols), 10.1002/(sici)1096-9918(199611)24:12<787::aid-sia181>3.0.co;2-e
  17. Galuska Alan A., ToF-SIMS Determination of Molecular Weights from Polymeric Surfaces and Microscopic Phases, 10.1002/(sici)1096-9918(199709)25:10<790::aid-sia301>3.0.co;2-f
  18. , . In Proc. 11th International Conference on Secondary Ion Mass Spectrometry SIMS XI, , , (eds). J. Wiley & Sons: Chichester, 1997; 571.
  19. Leeson Alistair M., Alexander Morgan R., Short Robert D., Briggs D., Hearn M. J., Secondary Ion Mass Spectrometry of Polymers: a ToF SIMS Study of Monodispersed PMMA Standards, 10.1002/(sici)1096-9918(199704)25:4<261::aid-sia233>3.0.co;2-k
  20. Vanden Eynde X., Bertrand P., Static SIMS spectra of polystyrene obtained by ‘living’ radical polymerization. Part II: Molecular weight quantification based on end groups, 10.1002/(sici)1096-9918(199807)26:8<579::aid-sia404>3.0.co;2-z
  21. Reihs K., Voetz M., Kruft M., Wolany D., Benninghoven A., Molecular weight determination of bulk polymer surfaces by static secondary ion mass spectrometry, 10.1007/s002160050353
  22. . Fundamentals of Polymer Sciences, Technomic Publishing 1994.
  23. Tezuka Yasuyuki, Imai Hiroshi, Shiomi Tomoo, Synthesis and ion-coupling reactions of telechelic polystyrene having cyclic onium salt groups, 10.1002/macp.1997.021980234
  24. , . to be published.
  25. Schueler Bruno W. , Microscope imaging by time-of-flight secondary ion mass spectrometry, 10.1051/mmm:0199200302-3011900
  26. Bertrand, Mikrochemica Acta, 167 (1996)
  27. Chilkoti Ashutosh, Castner David G., Ratner Buddy D., Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene, 10.1366/0003702914337588
  28. Affrossman S., Hartshorne M., Jerome R., Munro H., Pethrick R. A., Petitjean S., Rei Vilar M., Surface composition of poly(styrene-d8-styrene) random copolymers studied by static secondary ion mass spectroscopy, 10.1021/ma00072a017
  29. Affrossman S., Hartshorne M., Jerome R., Pethrick R. A., Petitjean S., Vilar M. Rei, Surface concentration of chain ends in polystyrene determined by static secondary ion mass spectroscopy, 10.1021/ma00075a020
  30. Leggett Graham J., Vickerman John C., Briggs David, Hearn Martin J., Surface studies by static secondary ion mass spectrometry: cluster ion formation studied by tandem mass-spectrometric techniques, 10.1039/ft9928800297
  31. Leggett Graham J., Vickerman John C., An empirical model for ion formation from polymer surfaces during analysis by secondary ion mass spectrometry, 10.1016/0168-1176(92)87021-6
  32. . Interpretation of Mass Spectra (4th edn), University Science Books: Sausalito, 1993.
  33. Delcorte A., Segda B.G., Bertrand P., ToF-SIMS analyses of polystyrene and dibenzanthracene: evidence for fragmentation and metastable decay processes in molecular secondary ion emission, 10.1016/s0039-6028(97)00070-8
  34. Delcorte A., Segda B.G., Bertrand P., Erratum to: “ToF-SIMS analyses of polystyrene and dibenzanthracene: Evidence of the fragmentation and metastable decay processes in the molecular secondary ion emission” [surf. sci. 381 (1997) 18], 10.1016/s0039-6028(97)00468-8
  35. Delcorte A, Bertrand P, Metastable decay of molecular fragment ions sputtered from hydrocarbon polymers under keV ion bombardment, 10.1016/s1387-3806(99)00012-3
  36. Wood K. V., Rothwell A. P., Scarpetti D., Fuchs P. L.., Mass spectra of ω-substituted α-trimethylsilyl phenylsulfones, 10.1002/oms.1210260109
  37. Wood Karl V., Rothwell Arlene P., Scarpetti David, Fuchs Philip L., Evidence for a double intramolecular trimethylsilyl rearrangement, 10.1002/oms.1210270205
  38. Weber William P., Felix Raymond A., Willard Alvin K., Mass spectral rearrangements. Silyl McLafferty rearrangement, 10.1021/ja00708a063