User menu

ToF-SIMS and XPS study of thin multilayered coatings realized by successive adsorption and functionalization of charged polymer layers

Bibliographic reference Delcorte, Arnaud ; Bertrand, Patrick ; Wischerhoff, Erik ; Laschewsky, André. ToF-SIMS and XPS study of thin multilayered coatings realized by successive adsorption and functionalization of charged polymer layers. In: G. Gillen, R. Lareau, J. Bennett, F. Stevie, Secondary Ion Mass Spectrometry: SIMS XI, John Wiley & Sons Publs  : New York, USA 1998, p. 533-536
Permanent URL http://hdl.handle.net/2078.1/78813