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Combining TOF-SIMS with XPS and AFM to quantify organic surface coverages

Bibliographic reference Kenens, C. ; conard, T. ; Hellemans, L. ; Bertrand, Patrick ; Vandervorst, W.. Combining TOF-SIMS with XPS and AFM to quantify organic surface coverages.12th International Conference on Secondary Ion Mass Spectrometry and Related Topics, SIMS XII (Brussels, Belgium, du 05/09/1999 au 10/09/1999). In: A. Benninghoven, P. Bertrand, H.-N. Migeon and H. Werner, Secondary Ion Mass Spectrometry, SIMS XII, Elsevier Science Publ. , : Amsterdam2000, p. 821-824
Permanent URL http://hdl.handle.net/2078.1/78739