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Albumin adsorption on polycarbonate : correlation between XPS and TOF-SIMS analyses

Bibliographic reference Rouxhet, Laurence ; Bertrand, Patrick. Albumin adsorption on polycarbonate : correlation between XPS and TOF-SIMS analyses.12th International Conference on Secondary Ion Mass Spectrometry and Related Topics, SIMS XII (Brussels, Belgium, September 5-10, 1999). In: A. Benninghoven, P. Bertrand, H.-N. Migeon and H. Werner, Secondary Ion Mass Spectrometry, SIMS XII, Elsevier Science Publ. : Amsterdam2000, p. 907-910
Permanent URL http://hdl.handle.net/2078.1/78651