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New on-chip testing method for ultra thin metallic films

Bibliographic reference Iker, François ; André, Nicolas ; Pardoen, Thomas ; Raskin, Jean-Pierre. New on-chip testing method for ultra thin metallic films.Euromech Colloquium 463 - Size dependent mechanics of materials (Groningen, The Netherlands, du 13/06/2005 au 15/06/2005). In: Proceedings of the Euromech Colloquium 463 - Size dependent mechanics of materials, 2005, p. Poster 5
Permanent URL http://hdl.handle.net/2078.1/76742