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Cohesive zone based modelling of Si/Si and SiO2/SiO2 interfaces in the presence of ductile interlayers

Bibliographic reference Bertholet, Y. ; Raskin, Jean-Pierre ; Pardoen, Thomas. Cohesive zone based modelling of Si/Si and SiO2/SiO2 interfaces in the presence of ductile interlayers.11th International Conference on Fracture (Turin (Italy), du 20/03/2005 au 25/03/2005). In: Proceedings of ICH11 , A. Carpenteri ed.2005, p. 5087
Permanent URL http://hdl.handle.net/2078.1/76741