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Use of X-ray photoelectron spectroscopy and atomic force microscopy for studying interfaces in biofilms

Bibliographic reference Rouxhet, Paul ; Dupont-Gillain, Christine C. ; Genet, Michel ; Dufrêne, Yves. Use of X-ray photoelectron spectroscopy and atomic force microscopy for studying interfaces in biofilms. In: Lens, P., Moran, A.P., Mahony, T., Stoodley, P. and O'Flaherty, V., Biofilms in Medecine, Industry and Environmental Biotechnology, IWA Publishing,  : London 2003, p.Ch. 16, p. 259-284
Permanent URL http://hdl.handle.net/2078.1/76682