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On-chip testing laboratory for nanomechanical characterization of thin films
Primary tabs
Boé, A.
[-]
Coulombier, Michaël
[UCL]
Safi, A.
[-]
Pardoen, Thomas
[UCL]
Raskin, Jean-Pierre
[UCL]
Safi, A.
[-]
Pardoen, Thomas
[UCL]
Raskin, Jean-Pierre
[UCL]
| Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
|---|---|
| Publication date | 2009 |
| Language | Anglais |
| Conference | "the 2009 SEM Annual Conference and Exposition on Experimental and Applied Mechanics", Albuquerque, NM USA (du 01/06/2009 au 04/06/2009) |
| Peer reviewed | yes |
| Host document | "Proceedings of the 2009 SEM Annual Conference and Exposition on Experimental and Applied Mechanics"- p. - |
| Publisher | Society for Experimental Mechanics Inc. ed(s) |
| Publication status | Publié |
| Affiliations |
-
- - UCL - FSA/MAPR - Département des sciences des matériaux et des procédés UCL - FSA/ELEC - Département d'électricité |
| Links |
| Bibliographic reference | Boé, A. ; Coulombier, Michaël ; Safi, A. ; Pardoen, Thomas ; Raskin, Jean-Pierre. On-chip testing laboratory for nanomechanical characterization of thin films.the 2009 SEM Annual Conference and Exposition on Experimental and Applied Mechanics (Albuquerque, NM USA, du 01/06/2009 au 04/06/2009). In: Proceedings of the 2009 SEM Annual Conference and Exposition on Experimental and Applied Mechanics, Society for Experimental Mechanics Inc. ed(s)2009, p. - |
|---|---|
| Permanent URL | http://hdl.handle.net/2078.1/76366 |