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TEM characterization of twinned nanocrystalline palladium thin films

Bibliographic reference Idrissi, H. ; Wang, B. ; Colla, Marie-Stéphane ; Raskin, Jean-Pierre ; Schrijvers, D. ; et. al. TEM characterization of twinned nanocrystalline palladium thin films.2010 Materials Research Society Fall Meeting - MRS Fall'10 (Boston, MA, USA, du 29/11/2010 au 03/12/2010). In: Proceedings of the 2010 Materials Research Society Fall Meeting, 2010, p. paper # P1.3.
Permanent URL http://hdl.handle.net/2078.1/76200