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Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS

Bibliographic reference Nittler, Laurent ; Delcorte, Arnaud ; Bertrand, Patrick ; Migeon, Henry-Noël. Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS. In: Surface and Interface Analysis, Vol. 43, no. 1-2, p. 103-106 (2011)
Permanent URL http://hdl.handle.net/2078.1/76177
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