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Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS

Bibliographic reference Nittler, Laurent ; Delcorte, Arnaud ; Bertrand, Patrick ; Migeon, Henry-Noël. Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS. In: Surface and Interface Analysis, Vol. 43, no. 1-2, p. 103-106 (2011)
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  1. Karen, Proceedings SIMS IX, 789 (1994)
  2. Yanashima, Proceedings SIMS X, 751 (1996)
  3. Travaly Y., Bertrand P., Static SIMS investigation of metal/polymer interfaces, 10.1002/sia.740230509
  4. Delcorte A., Médard N., Bertrand P., Organic Secondary Ion Mass Spectrometry:  Sensitivity Enhancement by Gold Deposition, 10.1021/ac020125h
  5. Weibel D.E., Lockyer N., Vickerman J.C., C60 cluster ion bombardment of organic surfaces, 10.1016/j.apsusc.2004.03.098
  6. Winograd Nicholas, The Magic of Cluster SIMS, 10.1021/ac053355f
  7. Delcorte A., Poleunis C., Bertrand P., Stretching the limits of static SIMS with C60+, 10.1016/j.apsusc.2006.02.259
  8. Delcorte A., Bour J., Aubriet F., Muller J.-F., Bertrand P., Sample Metallization for Performance Improvement in Desorption/Ionization of Kilodalton Molecules:  Quantitative Evaluation, Imaging Secondary Ion MS, and Laser Ablation, 10.1021/ac0302105
  9. Delcorte A, Bertrand P, Arys X, Jonas A, Wischerhoff E, Mayer B, Laschewsky A, ToF-SIMS study of alternate polyelectrolyte thin films: Chemical surface characterization and molecular secondary ions sampling depth, 10.1016/0039-6028(96)00779-0
  10. Tanuma S., Powell C. J., Penn D. R., Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50-2000 eV range, 10.1002/sia.740210302
  11. Inoue Masae, Murase Atsushi, Molecular weight evaluation of poly-dimethylsiloxane on solid surfaces using silver deposition/TOF-SIMS, 10.1016/j.apsusc.2004.03.066
  12. Gilmore I.S., Seah M.P., Electron flood gun damage in the analysis of polymers and organics in time-of-flight SIMS, 10.1016/s0169-4332(01)00787-5
  13. Tougaard S., Hansen H. S., Non-destructive depth profiling through quantitative analysis of surface electron spectra, 10.1002/sia.740141109
  14. Tougaard S., Surface nanostructure determination by x‐ray photoemission spectroscopy peak shape analysis, 10.1116/1.579963
  15. Zhang Z., Atomistic Processes in the Early Stages of Thin-Film Growth, 10.1126/science.276.5311.377
  16. Briggs, Handbook of Static Secondary Ion Mass Spectrometry (SIMS), 42 (1989)
  17. Heile A., Lipinsky D., Wehbe N., Delcorte A., Bertrand P., Felten A., Houssiau L., Pireaux J.-J., De Mondt R., Van Vaeck L., Arlinghaus H.F., Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement, 10.1016/j.apsusc.2008.05.007
  18. A. Prabhakaran N. Wehbe S. Yunus P. Bertrand A. Delcorte
  19. O. Restrepo A. Delcorte