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C-60 molecular depth profiling of bilayered polymer films using ToF-SIMS

Bibliographic reference Mouhib, Taoufiq ; Bertrand, Patrick ; Poleunis, Claude ; Delcorte, Arnaud. C-60 molecular depth profiling of bilayered polymer films using ToF-SIMS. In: Surface and Interface Analysis, Vol. 43, no. 1-2, p. 175-178 (2011)
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