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C-60 molecular depth profiling of bilayered polymer films using ToF-SIMS

Bibliographic reference Mouhib, Taoufiq ; Bertrand, Patrick ; Poleunis, Claude ; Delcorte, Arnaud. C-60 molecular depth profiling of bilayered polymer films using ToF-SIMS. In: Surface and Interface Analysis, Vol. 43, no. 1-2, p. 175-178 (2011)
Permanent URL http://hdl.handle.net/2078.1/76173
  1. Jones Emrys A., Lockyer Nicholas P., Vickerman John C., Depth Profiling Brain Tissue Sections with a 40 keV C60+Primary Ion Beam, 10.1021/ac702127q
  2. Mahoney Christine M., Yu Jinxiang, Fahey Albert, Gardella Joseph A., SIMS depth profiling of polymer blends with protein based drugs, 10.1016/j.apsusc.2006.02.251
  3. Geiser Alain, Fan Bin, Benmansour Hadjar, Castro Fernando, Heier Jakob, Keller Beat, Mayerhofer Karl Emanuel, Nüesch Frank, Hany Roland, Poly(3-hexylthiophene)/C60 heterojunction solar cells: Implication of morphology on performance and ambipolar charge collection, 10.1016/j.solmat.2007.11.001
  4. Mouhib, Surf. Interface Anal. (2010)
  5. Fletcher John S., Vickerman John C., A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems, 10.1007/s00216-009-2986-3
  6. Gillen Greg, Roberson Sonya, Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry, 10.1002/(sici)1097-0231(19981015)12:19<1303::aid-rcm330>3.0.co;2-7
  7. Delcorte Arnaud, Garrison Barbara J., Sputtering Polymers with Buckminsterfullerene Projectiles:  A Coarse-Grain Molecular Dynamics Study†, 10.1021/jp074536j
  8. Cheng Juan, Wucher Andreas, Winograd Nicholas, Molecular Depth Profiling with Cluster Ion Beams, 10.1021/jp0573341
  9. Nieuwjaer N., Poleunis C., Delcorte A., Bertrand P., Depth profiling of polymer samples using Ga+and C60+ion beams, 10.1002/sia.2931
  10. Shard Alexander G., Green Felicia M., Brewer Paul J., Seah Martin P., Gilmore Ian S., Quantitative Molecular Depth Profiling of Organic Delta-Layers by C60Ion Sputtering and SIMS†, 10.1021/jp077325n
  11. Kozole Joseph, Wucher Andreas, Winograd Nicholas, Energy Deposition during Molecular Depth Profiling Experiments with Cluster Ion Beams, 10.1021/ac8002962
  12. Shard A. G., Brewer P. J., Green F. M., Gilmore I. S., Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials, 10.1002/sia.2525
  13. Wagner M. S., Molecular Depth Profiling of Multilayer Polymer Films Using Time-of-Flight Secondary Ion Mass Spectrometry, 10.1021/ac048945c
  14. Mahoney Christine M., Fahey Albert J., Gillen Greg, Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 1. Investigation of Depth Profile Characteristics, 10.1021/ac061356h
  15. Iltgen K., Bendel C., Benninghoven A., Niehuis E., Optimized time-of-flight secondary ion mass spectroscopy depth profiling with a dual beam technique, 10.1116/1.580874
  16. Weibel Daniel, Wong Steve, Lockyer Nicholas, Blenkinsopp Paul, Hill Rowland, Vickerman John C., A C60Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics, 10.1021/ac026338o
  17. Mahoney Christine M., Fahey Albert J., Gillen Greg, Xu Chang, Batteas James D., Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS), 10.1016/j.apsusc.2006.02.078
  18. Wagner M. S., Impact Energy Dependence of SF5+-Induced Damage in Poly(methyl methacrylate) Studied Using Time-of-Flight Secondary Ion Mass Spectrometry, 10.1021/ac035330r