Accès à distance ? S'identifier sur le proxy UCLouvain
TEM characterization of freestanding Pd and Al films for lab-on-chip nanomechanical tensile testing
Primary tabs
Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
---|---|
Publication date | 2010 |
Language | Anglais |
Conference | "MICROSCIENCE 2010", London, UK (du 29/06/2010 au 01/07/2011) |
Peer reviewed | yes |
Host document | "Proceedings of the MICROSCIENCE 2010"- p. paper M3.2 - 0062 |
Publication status | Publié |
Affiliations |
UCL
- SST/IMMC/IMAP - Materials and process engineering UCL - UCL - SST/ICTM - Institute of Information and Communication Technologies, Electronics and Applied Mathematics |
Links |
Bibliographic reference | Schrijvers, D. ; Idrissi, H. ; Wang, B. ; Colla, Marie-Stéphane ; Coulombier, Michaël ; et. al. TEM characterization of freestanding Pd and Al films for lab-on-chip nanomechanical tensile testing.MICROSCIENCE 2010 (London, UK, du 29/06/2010 au 01/07/2011). In: Proceedings of the MICROSCIENCE 2010, 2010, p. paper M3.2 - 0062 |
---|---|
Permanent URL | http://hdl.handle.net/2078.1/75751 |