User menu

TEM characterization of freestanding Pd and Al films for lab-on-chip nanomechanical tensile testing

Bibliographic reference Schrijvers, D. ; Idrissi, H. ; Wang, B. ; Colla, Marie-Stéphane ; Coulombier, Michaël ; et. al. TEM characterization of freestanding Pd and Al films for lab-on-chip nanomechanical tensile testing.MICROSCIENCE 2010 (London, UK, du 29/06/2010 au 01/07/2011). In: Proceedings of the MICROSCIENCE 2010, 2010, p. paper M3.2 - 0062
Permanent URL http://hdl.handle.net/2078.1/75751