User menu

Mechanical and electromechanical on-chip testing of mono- and poly-crystalline silicon nanobeams

Bibliographic reference Raskin, Jean-Pierre ; Passi, Vikram ; Bhaskar, Umesh Kumar ; Zulfiqar, Azeem ; Pardoen, Thomas. Mechanical and electromechanical on-chip testing of mono- and poly-crystalline silicon nanobeams.2010 Materials Research Society Fall Meeting - MRS Fall'10 (Boston, MA, USA, du 2911/2010 au 03/12/2010). In: Proceedings of the 2010 Materials Research Society Fall Meeting - MRS Fall'10, 2010
Permanent URL http://hdl.handle.net/2078.1/75750