User menu

MEMS based microstructures for nanomechanical characterization of thin films (oral pres. by A. Boé)

Bibliographic reference Boé, A. ; Coulombier, Michaël ; Ryelandt, Sophie ; Pardoen, Thomas ; Raskin, Jean-Pierre. MEMS based microstructures for nanomechanical characterization of thin films (oral pres. by A. Boé).GDR MECANO - 2ème atelier général Ecole des Mines de Paris (Paris, du 23/04/2009 au 24/04/2009).
Permanent URL http://hdl.handle.net/2078.1/75646