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TEM observation of damage in aluminium thin films using on-chip nanomechanical testing laboratory (poster pres. by M. Coulombier)

Bibliographic reference Coulombier, Michaël ; Boé, A. ; Ryelandt, Sophie ; Pardoen, Thomas ; Raskin, Jean-Pierre. TEM observation of damage in aluminium thin films using on-chip nanomechanical testing laboratory (poster pres. by M. Coulombier).GDR MECANO - 2ème atelier général Ecole des Mines de Paris (Paris, du 23/04/2009 au 24/04/2009).
Permanent URL http://hdl.handle.net/2078.1/75644