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Size dependent ductility of thin metallic films using internal stress driven nanotesting structures

Bibliographic reference Coulombier, Michaël ; Boé, A. ; Ryelandt, Sophie ; Brugger, Charles ; Wang, B. ; et. al. Size dependent ductility of thin metallic films using internal stress driven nanotesting structures .Innovations in Thin Film Processing and Characterization - ITFPC'09 (Nancy - France, du 17/11/2009 au 20/11/2009).
Permanent URL http://hdl.handle.net/2078.1/75638