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Joint use of X-ray photoelectron spectroscopy and analytical electron microscopy in the investigation of cobalt and nickel oxide supported on Na-doped alumina

Bibliographic reference Defossé, C. ; Houalla, M. ; Lycourgiotis, A. ; Delannay, Francis. Joint use of X-ray photoelectron spectroscopy and analytical electron microscopy in the investigation of cobalt and nickel oxide supported on Na-doped alumina.6th Internat. Congress on Catalysis (Tokyo, 1980). In: Proceedings 6th Internat. Congress on Catalysis, T. Seiyama, and K. Tanabe, eds. : Amsterdam1980, p. 108-121
Permanent URL http://hdl.handle.net/2078.1/75011