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Critical assessment by analytical electron microscopy of the significance of XPS measurements of the dispersion of supported catalysts

Bibliographic reference Delannay, Francis ; Houalla, M. ; Pirotte, D. ; Delmon, Bernard. Critical assessment by analytical electron microscopy of the significance of XPS measurements of the dispersion of supported catalysts. In: Surface and Interface Analysis, Vol. 1, no. -, p. 172 - 174 (1979)
Permanent URL http://hdl.handle.net/2078.1/74754