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Silicon isotopes as a new tracer to quantify superficial processes: the geological perspective

Bibliographic reference André, Luc ; Cardinal, Damien ; Opfergelt, Sophie. Silicon isotopes as a new tracer to quantify superficial processes: the geological perspective.Geologica Belgica Conference, 2006 (Liège, du 07/09/2006 au 08/09/2006).
Permanent URL http://hdl.handle.net/2078.1/72931