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The effect of highly ionising particles on the CMS silicon strip tracker
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Document type | Article de périodique (Journal article) – Article de recherche |
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Access type | Accès restreint |
Publication date | 2005 |
Language | Anglais |
Journal information | "Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment" - Vol. 543, no. 2-3, p. 463-482 (2005) |
Peer reviewed | yes |
Publisher | Elsevier BV * North-Holland ((Netherlands) Amsterdam) |
issn | 0168-9002 |
e-issn | 1872-9576 |
Publication status | Publié |
Affiliations |
UCL
- SC/PHYS - Département de physique UCL - SC/SC - Faculté des sciences |
Keywords | CMS ; "Silicon strip tracker" ; Radiation ; "magnetic detector" ; CMS ; "CERN LHC Coll" ; APV25 ; "Highly ionising particles" ; "semiconductor detector" ; Microstrip ; Electronics ; Readout ; "integrated circuit" ; "radiation damage" |
Links |
Bibliographic reference | Assouak, Samia ; Bonnet, Jean-Luc ; de Callatay, Bernard ; Bruno, Giacomo ; de Favereau de Jeneret, Jérôme ; et. al. The effect of highly ionising particles on the CMS silicon strip tracker. In: Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, Vol. 543, no. 2-3, p. 463-482 (2005) |
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Permanent URL | http://hdl.handle.net/2078.1/71984 |