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Stress relaxation in Al-Si-Cu thin films and lines

Bibliographic reference Witvrouw, A. ; Proost, Joris ; Deweerdt, B. ; Roussel, Ph. ; Maex, K.. Stress relaxation in Al-Si-Cu thin films and lines.the Materials Research Society Symposium (Boston - MA, 1995). In: Proceedings , 1995, p. 441
Permanent URL http://hdl.handle.net/2078/70956