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On the mechanism of creep-controlled electromigration-induced drift
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| Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
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| Publication date | 2005 |
| Language | Anglais |
| Conference | "the Minerals, Metals and Materials Society (TMS) Symposium on Mechanical Behaviour of Thin Films and Small Structures", San Francisco (February 2005) |
| Peer reviewed | yes |
| Host document | "Proceedings "- p. 97 |
| Affiliation | UCL - FSA/MAPR - Département des sciences des matériaux et des procédés |
| Links |
| Bibliographic reference | Proost, Joris ; Jin, M. ; D'Haen, J.. On the mechanism of creep-controlled electromigration-induced drift.the Minerals, Metals and Materials Society (TMS) Symposium on Mechanical Behaviour of Thin Films and Small Structures (San Francisco, February 2005). In: Proceedings , 2005, p. 97 |
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| Permanent URL | http://hdl.handle.net/2078.1/70939 |