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On the mechanism of creep-controlled electromigration-induced drift

Bibliographic reference Proost, Joris ; Jin, M. ; D'Haen, J.. On the mechanism of creep-controlled electromigration-induced drift.the Minerals, Metals and Materials Society (TMS) Symposium on Mechanical Behaviour of Thin Films and Small Structures (San Francisco, February 2005). In: Proceedings , 2005, p. 97
Permanent URL http://hdl.handle.net/2078.1/70939