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In-situ optical monitoring of dielectric and electrostrictive properties of anodised thin films for biochip applications

Bibliographic reference Proost, Joris ; Vanhumbeeck, J.-F.. In-situ optical monitoring of dielectric and electrostrictive properties of anodised thin films for biochip applications.11th International Symposium on Colloidal and Molecular Electro-Optics (Kyoto, 2006). In: Proceedings , 2006, p. 21
Permanent URL http://hdl.handle.net/2078.1/70907