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In-situ diagnostics for monitoring the processing and properties of anodised metallic oxide thin films

Bibliographic reference Vanhumbeeck, J.-F. ; Proost, Joris. In-situ diagnostics for monitoring the processing and properties of anodised metallic oxide thin films.Electroceramics X (Toledo, 2006). In: Electroceramics X, 2006, p. Abstract TTF-O-01
Permanent URL http://hdl.handle.net/2078.1/70906