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In-situ monitoring of the internal stress evolution during thin film anodising

Bibliographic reference Proost, Joris ; Vanhumbeeck, Jean-François ; Van Overmeere, Quentin. In-situ monitoring of the internal stress evolution during thin film anodising.Invited presentation in Symposium on Stress Related Phenomena in Electrochemical Systems (Washington DC, 2007). In: Proceedings of the 212th Meeting of the Electrochemical Society, 2007, p. #1435
Permanent URL http://hdl.handle.net/2078.1/70894