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In-situ monitoring of the growth stress evolution during galvanostatic anodising of aluminium thin films

Bibliographic reference Van Overmeere, Quentin ; Vanhumbeeck, Jean-François ; Proost, Joris. In-situ monitoring of the growth stress evolution during galvanostatic anodising of aluminium thin films.213th Meeting of the Electrochemical Society (Phoenix, 2008). In: Proceedings, 2008, p. #594
Permanent URL http://hdl.handle.net/2078.1/70885