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Evaluation of the effect of process choices on reliability by the use of the isocurrent test

Bibliographic reference Proost, Joris ; Witvrouw, Ann ; Maex, Karen. Evaluation of the effect of process choices on reliability by the use of the isocurrent test.European Adequat+ Meeting on Advanced Developments for CMOS for 0.25 µm and below (Munich, May 1996).
Permanent URL http://hdl.handle.net/2078/70739