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Ellipsometric porosimetry studies of amorphous alumina thin films

Bibliographic reference Proost, Joris ; Spaepen, F.. Ellipsometric porosimetry studies of amorphous alumina thin films.Invited contribution to the Gordon Research Conference on Solid State Studies in Ceramics (Meriden, NH, July 2004).
Permanent URL http://hdl.handle.net/2078.1/70737