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Characterization of the mechanical properties of freestanding palladium films by on chip internal stress controlled nanomechanical tensile testing

Bibliographic reference Colla, Marie-Stéphane ; Coulombier, Michaël ; Boé, A. ; Idrissi, H. ; Wang, B. ; et. al. Characterization of the mechanical properties of freestanding palladium films by on chip internal stress controlled nanomechanical tensile testing.Nanobrucken Nanomechanical testing Workshop, INM (Saarbrucken - Germany, 25-26/02/2010). In: Proceedings of the Nanomechanical Testing Workshop and Hysitron User Meeting, INM : Saarbrücken, Germany2010, p.29-30
Permanent URL http://hdl.handle.net/2078.1/70729