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The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)

Bibliographic reference Proost, Joris ; Samajdar, I. ; Verlinden, B. ; Van Houtte, Paul ; Maex, K. ; et. al. The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu). In: Scripta Materialia, Vol. 39, no. 8, p. 1039-1045 (1998)
Permanent URL http://hdl.handle.net/2078/70724